Tektronix announced a series of new high-speed pattern generators and error detectors that can support up to 32Gb / s optical communication and serial data communication testing.
The PPG3000 series pattern generator and the PED3000 series error code detector have multi-channel pattern generation and user-defined pattern programming functions. They are suitable for specific standards like 100G Ethernet, with up to four channels for special Signal quality range test (Margin Test).
The market is investing more in the development of high-speed optical communications and data communications than ever before, in order to respond to the constant and rapid demand for a large number of bandwidth tests like smart phones, tablet computers and video applications. Data communication researchers and designers also need high-speed test equipment to analyze and test the characteristics of optical and serial interfaces. Usually, they use multi-channel instruments with a data rate of 10 to 32 Gb / s per channel.
For testing coherent optical modulation formats such as DP-QPSK, the PPG3000 series can be used with its four-phase aligned channels with the Tektronix OM4000 series optical wave coherence signal analyzer, allowing optical designers to optimize and verify the coherence modulation format in real time.
Tektronix website:
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